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Scaning Electron Microscope Lab

Contact information:

We welcome inquiries from faculty, students, and professionals. Fees are charged for analytical services.
For further information contact Dr. Juergen Schieber.

Email: jschiebe@indiana.edu | Phone: 812-855-5322

Mailing Address: Scanning Electron Microscope Lab,
Department of Earth and Atmospheric Sciences, Indiana University
Bloomington, IN 47405-1405 U.S.A.

description:

The FEI Quanta 400 FEG Scanning Electron Microscope (SEM) is a versatile high performance instrument equipped with a field emission gun and nominal resolution of <2 nm. It can be operated in high-vacuum, low-vacuum and ESEM modes and accommodates a wide range of samples. In addition to secondary electron mode (SEM), the instrument is equipped with a backscatter electron detector, a Peltier cold stage, and an PGT thin-window energy-dispersive X-ray spectrometer capable of analyzing elements down to C. The SEM is also equipped with an HKL electron backscatter diffraction detector for crystal structure identification and orientation mapping, and a Gatan Chroma-CLII cathodoluminescence detector for live color rendering.

No coating needed, can image moist materials, microbes survive study under the beam. NSF funded

Capabilities
  • Se, BSE
  • gaseous detectors
  • digital imaging and image processing
  • Peltier Stage
  • Color CL detector (GATAN Chroma CL)
  • EDS (PGE Spirit, PTS mapping)
  • EBSD detector (HKL, Phase ID, crystal structure and orientation)